Modules / Lectures


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Digital VLSI Testing Assignment SolutionsDigital VLSI Testing Assignment Solutions

Sl.No Chapter Name English
1Lecture 1: IntroductionPDF unavailable
2Lecture 2: Introduction (Contd.)PDF unavailable
3Lecture 3: Introduction (Contd.)PDF unavailable
4Lecture 4: Introduction (Contd.)PDF unavailable
5Lecture 5: DFTPDF unavailable
6Lecture 6: DFT (Contd.)PDF unavailable
7Lecture 7: DFT (Contd.)PDF unavailable
8Lecture 8: DFT (Contd.)PDF unavailable
9Lecture 9: DFT (Contd.)PDF unavailable
10Lecture 10:DFT (Contd.)PDF unavailable
11Lecture 11: Logic and Fault SimulationPDF unavailable
12Lecture 12: Logic and Fault Simulation (Contd.)PDF unavailable
13Lecture 13: Logic and Fault Simulation (Contd.)PDF unavailable
14Lecture 14: Logic and Fault Simulation (Contd.)PDF unavailable
15Lecture 15: Logic and Fault Simulation (Contd.)PDF unavailable
16Lecture 16: Logic and Fault Simulation (Contd.)PDF unavailable
17Lecture 17: Test GenerationPDF unavailable
18Lecture 18: Test Generation (Contd.)PDF unavailable
19Lecture 19: Test Generation (Contd.)PDF unavailable
20Lecture 20: Test Generation (Contd.)PDF unavailable
21Lecture 21: Test Generation (Contd.)PDF unavailable
22Lecture 22: Test Generation (Contd.)PDF unavailable
23Lecture 23: Test Generation (Contd.)PDF unavailable
24Lecture 24: Logic BISTPDF unavailable
25Lecture 25: Logic BIST (Contd.)PDF unavailable
26Lecture 26: Logic BIST (Contd.)PDF unavailable
27Lecture 27: Logic BIST (Contd.)PDF unavailable
28Lecture 28: Test CompressionPDF unavailable
29Lecture 29: Test Compression (Contd.)PDF unavailable
30Lecture 30: Test Compression (Contd.)PDF unavailable
31Lecture 31: Test Compression (Contd.)PDF unavailable
32Lecture 32: Low Power TestingPDF unavailable
33Lecture 33: Low Power Testing (Contd.)PDF unavailable
34Lecture 34: Low Power Testing (Contd.)PDF unavailable
35Lecture 35: Low Power Testing (Contd.)PDF unavailable
36Lecture 36: Low Power Testing (Contd.)PDF unavailable
37Lecture 37 : Thermal Aware TestingPDF unavailable
38Lecture 38 : Thermal Aware Testing (Contd.)PDF unavailable
39Lecture 39 : Thermal Aware Testing (Contd.)PDF unavailable
40Lecture 40 : Boundary ScanPDF unavailable
41Lecture 41 : Boundary Scan (Contd.)PDF unavailable
42Lecture 42 : Boundary Scan (Contd.)PDF unavailable
43Lecture 43 : Boundary Scan (Contd.)PDF unavailable
44Lecture 44 : Boundary Scan (Contd.)PDF unavailable
45Lecture 45 : System/Network - On - Chip TestPDF unavailable
46Lecture 46 : System/Network - On - Chip Test (Contd.)PDF unavailable
47Lecture 47 : System/Network - On - Chip Test (Contd.)PDF unavailable
48Lecture 48 : System/Network - On - Chip Test (Contd.)PDF unavailable
49Lecture 49 : System/Network - On - Chip Test (Contd.)PDF unavailable
50Lecture 50 : System/Network - On - Chip Test (Contd.)PDF unavailable
51Lecture 51 : System/Network - On - Chip Test (Contd.)PDF unavailable
52Lecture 52 : System/Network - On - Chip Test (Contd.)PDF unavailable
53Lecture 53 : System/Network - On - Chip Test (Contd.)PDF unavailable
54Lecture 54 : System/Network - On - Chip Test (Contd.)PDF unavailable
55Lecture 55 : System/Network - On - Chip Test (Contd.)PDF unavailable
56Lecture 56 : System/Network - On - Chip Test (Contd.)PDF unavailable
57Lecture 57 : Memory TestingPDF unavailable
58Lecture 58:Memory Testing (Contd.)PDF unavailable
59Lecture 59 : Memory Testing (Contd.)PDF unavailable
60Lecture 60 : Memory Testing (Contd.)PDF unavailable


Sl.No Language Book link
1EnglishNot Available
2BengaliNot Available
3GujaratiNot Available
4HindiNot Available
5KannadaNot Available
6MalayalamNot Available
7MarathiNot Available
8TamilNot Available
9TeluguNot Available