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Sl.No Chapter Name English
1Introduction Part-1PDF unavailable
2Introduction Part-2PDF unavailable
3Overview of VLSI Design FlowPDF unavailable
4High Level Synthesis Overview Part 1PDF unavailable
5High Level Synthesis Overview Part 2PDF unavailable
6Scheduling in HLS (Part-1)PDF unavailable
7Scheduling in HLS (Part-2) PDF unavailable
8Scheduling in HLS (Part-3) PDF unavailable
9Scheduling in HLS (Part-4)PDF unavailable
10Scheduling in HLS (Part-5)PDF unavailable
11Scheduling in HLS (Part-6)PDF unavailable
12Scheduling in HLS (Part-7)PDF unavailable
13Resource Sharing and Binding in HLS (Part-1)PDF unavailable
14Resource Sharing and Binding in HLS (Part-2)PDF unavailable
15Resource Sharing and Binding in HLS (Part-3)PDF unavailable
16Resource Sharing and Binding in HLS (Part-4)PDF unavailable
17Resource Sharing and Binding in HLS (Part-5)PDF unavailable
18Resource Sharing and Binding in HLS (Part-6)PDF unavailable
19Resource Sharing and Binding in HLS (Part-7)PDF unavailable
20Logic Synthesis (Part-1)PDF unavailable
21Logic Synthesis (Part-2)PDF unavailable
22Logic Synthesis (Part-3)PDF unavailable
23Physical Design (Part-1)PDF unavailable
24Physical Design (Part-2)PDF unavailable
25Physical Design (Part-3)PDF unavailable
26Introduction to formal methods for design verificationPDF unavailable
27Temporal Logic: Introduction and Basic Operations on Temporal LogicPDF unavailable
28Syntax and Semantics of CLTPDF unavailable
29Syntax and semantics of CTL continuedPDF unavailable
30Equivalences between CTL FormulasPDF unavailable
31Introduction to Model CheckingPDF unavailable
32Model checking AlgorithmsPDF unavailable
33Model checking Algorithms continued.PDF unavailable
34Model Checking with FairnessPDF unavailable
35Binary Decision Diagram: Introduction and ConstructionPDF unavailable
36Ordered Binary Decision Diagram (OBDD)PDF unavailable
37Operation On OBDD PDF unavailable
38OBDD for State Transition Systems EPDF unavailable
39Symbolic Model CheckingPDF unavailable
40Introduction to Digital VLSI TestingPDF unavailable
41Functional and Structural TestingPDF unavailable
42Fault EquivalencePDF unavailable
43Fault Simulation IPDF unavailable
44Fault Simulation IIPDF unavailable
45Fault Simulation IIIPDF unavailable
46Testability Measures (SCOAP)PDF unavailable
47Introduction to Automatic Test Pattern Generation (ATPG) and ATPG AlgebrasPDF unavailable
48D-Algorithm IPDF unavailable
49D-Algorithm IIPDF unavailable
50ATPG for Synchronous Sequential Circuits PDF unavailable
51Scan Chain based Sequential Circuit Testing I PDF unavailable
52Scan Chain based Sequential Circuit Testing IIPDF unavailable
53BIST IPDF unavailable
54BIST II PDF unavailable

Sl.No Language Book link
1EnglishNot Available
2BengaliNot Available
3GujaratiNot Available
4HindiNot Available
5KannadaNot Available
6MalayalamNot Available
7MarathiNot Available
8TamilNot Available
9TeluguNot Available