Modules / Lectures


Sl.No Chapter Name MP4 Download
1Lecture 01 : IntroductionDownload
2Lecture 02 : Texture and AnisotropyDownload
3Lecture 03 : Processing - Texture - Anisotropic PropertiesDownload
4Lecture 04 : Crystal Structure and Stereographic ProjectionsDownload
5Lecture 05 : Utilization of Stereographic ProjectionsDownload
6Lecture 06 : Diffraction and Bragg's LawDownload
7Lecture 07 : Structure Factor and Diffraction Extinction CriteriaDownload
8Lecture 08 : Structure factor and diffraction extinction criteria (Contd.)Download
9Lecture 09 : Pole figuresDownload
10Lecture 10 : Pole figures (Contd.)Download
11Lecture 11 : Inverse Pole FiguresDownload
12Lecture 12 : Three Dimensional Texture AnalysisDownload
13Lecture 13 : Euler Angles and ODFsDownload
14Lecture 14 : Euler Angles and ODFs (Contd.)Download
15Lecture 15 : Euler Angles and ODFs (Contd.)Download
16Lecture 16 : Euler Angles and ODFs (Contd.)Download
17Lecture 17 : Symmetry Effects on Orientation MatrixDownload
18Lecture 18 : Euler Space and Orientation MatricesDownload
19Lecture 19 : Texture Fibre, Periodicity in Euler Space, Incomplete Pole FiguresDownload
20Lecture 20 : Crystal Structures and SymmetryDownload
21Lecture 21 : Size of Euler Space in Relation to Crystal and Sample SymmetryDownload
22Lecture 22 : Macrotexture and Microtexture MeasurementsDownload
23Lecture 23 : Penetration Depth of X-ray, Neutron, e-1 and Basics of X-ray GenerationDownload
24Lecture 24 : Characteristic X-ray, Absorption and FiltersDownload
25Lecture 25 : Principles of pole figure measurements by X-ray diffractionDownload
26Lecture 26 : Texture Goniometer ComponentsDownload
27Lecture 27 : Limitations and Errors in X-ray Texture Measurement and CorrectionsDownload
28Lecture 28 : Basics of Electron Microscopy - IDownload
29Lecture 29 : Basics of Electron Microscopy - IIDownload
30Lecture 30 : Kikuchi Diffraction Pattern - IDownload
31Lecture 31 : Kikuchi Diffraction Pattern - IIDownload
32Lecture 32 : Quantitative Evaluation of Kikuchi Diffraction Pattern - IDownload
33Lecture 33 : Quantitative evaluation of Kikuchi Diffraction Pattern IIDownload
34Lecture 34 : Quantitative evaluation of Kikuchi Diffraction Pattern IIIDownload
35Lecture 35 : Analysis using the TSL-OIM softwareDownload
36Lecture 36 : Analysis using the AZtecCrystal softwareDownload
37Lecture 37 : Analysis using the ATEX softwareDownload

Sl.No Chapter Name English
1Lecture 01 : IntroductionPDF unavailable
2Lecture 02 : Texture and AnisotropyPDF unavailable
3Lecture 03 : Processing - Texture - Anisotropic PropertiesPDF unavailable
4Lecture 04 : Crystal Structure and Stereographic ProjectionsPDF unavailable
5Lecture 05 : Utilization of Stereographic ProjectionsPDF unavailable
6Lecture 06 : Diffraction and Bragg's LawPDF unavailable
7Lecture 07 : Structure Factor and Diffraction Extinction CriteriaPDF unavailable
8Lecture 08 : Structure factor and diffraction extinction criteria (Contd.)PDF unavailable
9Lecture 09 : Pole figuresPDF unavailable
10Lecture 10 : Pole figures (Contd.)PDF unavailable
11Lecture 11 : Inverse Pole FiguresPDF unavailable
12Lecture 12 : Three Dimensional Texture AnalysisPDF unavailable
13Lecture 13 : Euler Angles and ODFsPDF unavailable
14Lecture 14 : Euler Angles and ODFs (Contd.)PDF unavailable
15Lecture 15 : Euler Angles and ODFs (Contd.)PDF unavailable
16Lecture 16 : Euler Angles and ODFs (Contd.)PDF unavailable
17Lecture 17 : Symmetry Effects on Orientation MatrixPDF unavailable
18Lecture 18 : Euler Space and Orientation MatricesPDF unavailable
19Lecture 19 : Texture Fibre, Periodicity in Euler Space, Incomplete Pole FiguresPDF unavailable
20Lecture 20 : Crystal Structures and SymmetryPDF unavailable
21Lecture 21 : Size of Euler Space in Relation to Crystal and Sample SymmetryPDF unavailable
22Lecture 22 : Macrotexture and Microtexture MeasurementsPDF unavailable
23Lecture 23 : Penetration Depth of X-ray, Neutron, e-1 and Basics of X-ray GenerationPDF unavailable
24Lecture 24 : Characteristic X-ray, Absorption and FiltersPDF unavailable
25Lecture 25 : Principles of pole figure measurements by X-ray diffractionPDF unavailable
26Lecture 26 : Texture Goniometer ComponentsPDF unavailable
27Lecture 27 : Limitations and Errors in X-ray Texture Measurement and CorrectionsPDF unavailable
28Lecture 28 : Basics of Electron Microscopy - IPDF unavailable
29Lecture 29 : Basics of Electron Microscopy - IIPDF unavailable
30Lecture 30 : Kikuchi Diffraction Pattern - IPDF unavailable
31Lecture 31 : Kikuchi Diffraction Pattern - IIPDF unavailable
32Lecture 32 : Quantitative Evaluation of Kikuchi Diffraction Pattern - IPDF unavailable
33Lecture 33 : Quantitative evaluation of Kikuchi Diffraction Pattern IIPDF unavailable
34Lecture 34 : Quantitative evaluation of Kikuchi Diffraction Pattern IIIPDF unavailable
35Lecture 35 : Analysis using the TSL-OIM softwarePDF unavailable
36Lecture 36 : Analysis using the AZtecCrystal softwarePDF unavailable
37Lecture 37 : Analysis using the ATEX softwarePDF unavailable


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1EnglishNot Available
2BengaliNot Available
3GujaratiNot Available
4HindiNot Available
5KannadaNot Available
6MalayalamNot Available
7MarathiNot Available
8TamilNot Available
9TeluguNot Available