| Module Name | Download |
|---|
| Sl.No | Chapter Name | MP4 Download |
|---|---|---|
| 1 | Lecture 01: Introduction to Microscopy | Download |
| 2 | Lecture 02: Scanning Electron Microscopy | Download |
| 3 | Lecture 03: SEM and Its Capabilities | Download |
| 4 | Lecture 04: Main Components of SEM - Electron Guns | Download |
| 5 | Lecture 05: Main Components of SEM - Electron Guns and Electromagnetic Lenses | Download |
| 6 | Lecture 06: Electron Probe Diameter Verses Electron Probe Current | Download |
| 7 | Lecture 07: Electron Beam - Specimen Interaction | Download |
| 8 | Lecture 08: Detectors | Download |
| 9 | Lecture 09: BSE Detector and Sample Preparation for SEM | Download |
| 10 | Lecture 10: Parameters Need to be Considered to obtain a Good SEM Image | Download |
| 11 | Lecture 11: How to Get a Good SEM Image | Download |
| 12 | Lecture 12: Additional Capabilities of SEM | Download |
| 13 | Lecture 13: Additional Capabilities of SEM (Contd.) | Download |
| 14 | Lecture 14: Additional Capabilities of SEM (Contd.) | Download |
| 15 | Lecture 15: Scanning Ion Microscopy - An Introduction | Download |
| 16 | Lecture 16: Ions Versus Electrons as Source for Microscopy | Download |
| 17 | Lecture 17: Ions Source in HIM | Download |
| 18 | Lecture 18: GFIS Properties and Ion Optical Column | Download |
| 19 | Lecture 19: Ion Optical Column | Download |
| 20 | Lecture 20: Ion-Solid Interactions and Signal Generation | Download |
| 21 | Lecture 26: STM- Instrumentation | Download |
| 22 | Lecture 27: Main Components of STM | Download |
| 23 | Lecture 28: Main Components of STM (Contd.) | Download |
| 24 | Lecture 29: Main Components of STM (Contd.) | Download |
| 25 | Lecture 30: Working Principle of STM | Download |
| 26 | Lecture 31: Operating Modes | Download |
| 27 | Lecture 32: Scanning Tunneling Spectroscopy | Download |
| 28 | Lecture 33: SPM - Atomic Force Microscopy (AFM) | Download |
| 29 | Lecture 34:Force Between Tip and Sample in AFM | Download |
| 30 | Lecture 35: Atomic Force Microscope - Parts | Download |
| Sl.No | Chapter Name | English |
|---|---|---|
| 1 | Lecture 01: Introduction to Microscopy | PDF unavailable |
| 2 | Lecture 02: Scanning Electron Microscopy | PDF unavailable |
| 3 | Lecture 03: SEM and Its Capabilities | PDF unavailable |
| 4 | Lecture 04: Main Components of SEM - Electron Guns | PDF unavailable |
| 5 | Lecture 05: Main Components of SEM - Electron Guns and Electromagnetic Lenses | PDF unavailable |
| 6 | Lecture 06: Electron Probe Diameter Verses Electron Probe Current | PDF unavailable |
| 7 | Lecture 07: Electron Beam - Specimen Interaction | PDF unavailable |
| 8 | Lecture 08: Detectors | PDF unavailable |
| 9 | Lecture 09: BSE Detector and Sample Preparation for SEM | PDF unavailable |
| 10 | Lecture 10: Parameters Need to be Considered to obtain a Good SEM Image | PDF unavailable |
| 11 | Lecture 11: How to Get a Good SEM Image | PDF unavailable |
| 12 | Lecture 12: Additional Capabilities of SEM | PDF unavailable |
| 13 | Lecture 13: Additional Capabilities of SEM (Contd.) | PDF unavailable |
| 14 | Lecture 14: Additional Capabilities of SEM (Contd.) | PDF unavailable |
| 15 | Lecture 15: Scanning Ion Microscopy - An Introduction | PDF unavailable |
| 16 | Lecture 16: Ions Versus Electrons as Source for Microscopy | PDF unavailable |
| 17 | Lecture 17: Ions Source in HIM | PDF unavailable |
| 18 | Lecture 18: GFIS Properties and Ion Optical Column | PDF unavailable |
| 19 | Lecture 19: Ion Optical Column | PDF unavailable |
| 20 | Lecture 20: Ion-Solid Interactions and Signal Generation | PDF unavailable |
| 21 | Lecture 26: STM- Instrumentation | PDF unavailable |
| 22 | Lecture 27: Main Components of STM | PDF unavailable |
| 23 | Lecture 28: Main Components of STM (Contd.) | PDF unavailable |
| 24 | Lecture 29: Main Components of STM (Contd.) | PDF unavailable |
| 25 | Lecture 30: Working Principle of STM | PDF unavailable |
| 26 | Lecture 31: Operating Modes | PDF unavailable |
| 27 | Lecture 32: Scanning Tunneling Spectroscopy | PDF unavailable |
| 28 | Lecture 33: SPM - Atomic Force Microscopy (AFM) | PDF unavailable |
| 29 | Lecture 34:Force Between Tip and Sample in AFM | PDF unavailable |
| 30 | Lecture 35: Atomic Force Microscope - Parts | PDF unavailable |
| Sl.No | Language | Book link |
|---|---|---|
| 1 | English | Not Available |
| 2 | Bengali | Not Available |
| 3 | Gujarati | Not Available |
| 4 | Hindi | Not Available |
| 5 | Kannada | Not Available |
| 6 | Malayalam | Not Available |
| 7 | Marathi | Not Available |
| 8 | Tamil | Not Available |
| 9 | Telugu | Not Available |