Modules / Lectures
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noc21_mm16_assignment_Week_3noc21_mm16_assignment_Week_3
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noc21_mm16_assignment_Week_8noc21_mm16_assignment_Week_8


Sl.No Chapter Name MP4 Download
1Lecture 01: Introduction to MicroscopyDownload
2Lecture 02: Scanning Electron MicroscopyDownload
3Lecture 03: SEM and Its CapabilitiesDownload
4Lecture 04: Main Components of SEM - Electron GunsDownload
5Lecture 05: Main Components of SEM - Electron Guns and Electromagnetic LensesDownload
6Lecture 06: Electron Probe Diameter Verses Electron Probe CurrentDownload
7Lecture 07: Electron Beam - Specimen InteractionDownload
8Lecture 08: DetectorsDownload
9Lecture 09: BSE Detector and Sample Preparation for SEM Download
10Lecture 10: Parameters Need to be Considered to obtain a Good SEM ImageDownload
11Lecture 11: How to Get a Good SEM ImageDownload
12Lecture 12: Additional Capabilities of SEMDownload
13Lecture 13: Additional Capabilities of SEM (Contd.)Download
14Lecture 14: Additional Capabilities of SEM (Contd.)Download
15Lecture 15: Scanning Ion Microscopy - An IntroductionDownload
16Lecture 16: Ions Versus Electrons as Source for MicroscopyDownload
17Lecture 17: Ions Source in HIMDownload
18Lecture 18: GFIS Properties and Ion Optical ColumnDownload
19Lecture 19: Ion Optical ColumnDownload
20Lecture 20: Ion-Solid Interactions and Signal GenerationDownload
21Lecture 21: Signal Generation and Contrast MechanismDownload
22Lecture 22: Contrast Mechanism and Imaging ModesDownload
23Lecture 23: Scanning Transmission Ion Microscopy and Microanalysis with HIMDownload
24Lecture 24: Creation and Modification of Materials by HIMDownload
25Lecture 25: Scanning probe microscopy, properties of SPMDownload
26Lecture 26: STM- InstrumentationDownload
27Lecture 27: Main Components of STMDownload
28Lecture 28: Main Components of STM (Contd.)Download
29Lecture 29: Main Components of STM (Contd.)Download
30Lecture 30: Working Principle of STMDownload
31Lecture 31: Operating ModesDownload
32Lecture 32: Scanning Tunneling SpectroscopyDownload
33Lecture 33: SPM - Atomic Force Microscopy (AFM)Download
34Lecture 34:Force Between Tip and Sample in AFMDownload
35Lecture 35: Atomic Force Microscope - PartsDownload
36Lecture 36: Modes of AFM OperationDownload
37Lecture 37: Dynamic mode AFM, Tapping modeDownload
38Lecture 38: AFM ImagingDownload
39Lecture 39: Phase Imaging, Noises and ResolutionDownload
40Lecture 40: Surface Properties Measurements using Other ForcesDownload
41Lecture 41: Surface Properties Measurements using AFMDownload
42Lecture 42: Manipulation of Atoms, Molecules and Industrial ApplicationsDownload
43Lecture 43: SummaryDownload

Sl.No Chapter Name English
1Lecture 01: Introduction to MicroscopyPDF unavailable
2Lecture 02: Scanning Electron MicroscopyPDF unavailable
3Lecture 03: SEM and Its CapabilitiesPDF unavailable
4Lecture 04: Main Components of SEM - Electron GunsPDF unavailable
5Lecture 05: Main Components of SEM - Electron Guns and Electromagnetic LensesPDF unavailable
6Lecture 06: Electron Probe Diameter Verses Electron Probe CurrentPDF unavailable
7Lecture 07: Electron Beam - Specimen InteractionPDF unavailable
8Lecture 08: DetectorsPDF unavailable
9Lecture 09: BSE Detector and Sample Preparation for SEM PDF unavailable
10Lecture 10: Parameters Need to be Considered to obtain a Good SEM ImagePDF unavailable
11Lecture 11: How to Get a Good SEM ImagePDF unavailable
12Lecture 12: Additional Capabilities of SEMPDF unavailable
13Lecture 13: Additional Capabilities of SEM (Contd.)PDF unavailable
14Lecture 14: Additional Capabilities of SEM (Contd.)PDF unavailable
15Lecture 15: Scanning Ion Microscopy - An IntroductionPDF unavailable
16Lecture 16: Ions Versus Electrons as Source for MicroscopyPDF unavailable
17Lecture 17: Ions Source in HIMPDF unavailable
18Lecture 18: GFIS Properties and Ion Optical ColumnPDF unavailable
19Lecture 19: Ion Optical ColumnPDF unavailable
20Lecture 20: Ion-Solid Interactions and Signal GenerationPDF unavailable
21Lecture 21: Signal Generation and Contrast MechanismPDF unavailable
22Lecture 22: Contrast Mechanism and Imaging ModesPDF unavailable
23Lecture 23: Scanning Transmission Ion Microscopy and Microanalysis with HIMPDF unavailable
24Lecture 24: Creation and Modification of Materials by HIMPDF unavailable
25Lecture 25: Scanning probe microscopy, properties of SPMPDF unavailable
26Lecture 26: STM- InstrumentationPDF unavailable
27Lecture 27: Main Components of STMPDF unavailable
28Lecture 28: Main Components of STM (Contd.)PDF unavailable
29Lecture 29: Main Components of STM (Contd.)PDF unavailable
30Lecture 30: Working Principle of STMPDF unavailable
31Lecture 31: Operating ModesPDF unavailable
32Lecture 32: Scanning Tunneling SpectroscopyPDF unavailable
33Lecture 33: SPM - Atomic Force Microscopy (AFM)PDF unavailable
34Lecture 34:Force Between Tip and Sample in AFMPDF unavailable
35Lecture 35: Atomic Force Microscope - PartsPDF unavailable
36Lecture 36: Modes of AFM OperationPDF unavailable
37Lecture 37: Dynamic mode AFM, Tapping modePDF unavailable
38Lecture 38: AFM ImagingPDF unavailable
39Lecture 39: Phase Imaging, Noises and ResolutionPDF unavailable
40Lecture 40: Surface Properties Measurements using Other ForcesPDF unavailable
41Lecture 41: Surface Properties Measurements using AFMPDF unavailable
42Lecture 42: Manipulation of Atoms, Molecules and Industrial ApplicationsPDF unavailable
43Lecture 43: SummaryPDF unavailable


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2BengaliNot Available
3GujaratiNot Available
4HindiNot Available
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7MarathiNot Available
8TamilNot Available
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