Characterization of materials is essential to the systematic development of new materials and understanding how they behave in practical applications. This course focuses on the principal methods required to characterize broad range of materials such as metal, alloys, semiconductors, insulators, polymers, ceramics, nanostructures etc. for their applications based on mechanical, electrical, optical, magnetic, thermal properties of materials.
The topics covers structure analysis tools, microscopy techniques, thermal analysis technique, electrical characterization, magnetic characterization, and optical spectroscopy, and other techniques for characterization of nanophase materials. The aim of this course is to provide introductory understanding of number important techniques in terms of the instrumentation, working principles, and information obtained and possible analysis of the materials.
This course is targeted towards undergraduate and postgraduate students of physics, materials science, metallurgy, energy technology, electrical engineering and electronics, polymer science and engineering etc.
Introduction to materials and Techniques,Structure analysis tools: X-ray diffraction: phase identification, indexing and lattice parameter determination, Analytical line profile fitting using various models, Neutron diffraction, Reflection High Energy Electron Diffraction, and Low Energy Electron Diffraction; Microscopy techniques: Optical microscopy, transmission electron microscopy (TEM), energy dispersive X-ray microanalysis (EDS), scanning electron microscopy (SEM), Rutherford backscattering spectrometry (RBS), atomic force microscopy (AFM) and scanning probe microscopy (SPM); Thermal analysis technique: Differential thermal analysis (DTA), Differential Scanning Calorimetry (DSC), Thermogravimetric analysis (TGA); Electrical characterization techniques: Electrical resistivity, Hall effect, Magnetoresistance; Magnetic characterization techniques: Introduction to Magnetism, Measurement Methods, Measuring Magnetization by Force, Measuring Magnetization by Induction method, Types of measurements using magnetometers: M-H loop, temperature dependent magnetization, time dependent magnetization, Measurements using AC susceptibility, Magneto-optical Kerr effect, Nuclear Magnetic Resonance, Electron Spin Resonance; Optical and electronic characterization techniques: UV-VIS spectroscopy, Fourier transform infrared spectroscopy, Raman spectroscopy, X-ray photoelectron spectroscopy.
The interested users may also go through other similar courses such as Materials Characterization by Dr. S. Sankaran and Prof. Viajaya Agarwala; and Advanced Characterization Techniques by Dr. K. Biswas and Dr. Gurao.
Module/ Lecture Topics
No. of Hours
Introduction to materials and Techniques
2. Structure analysis tools:
Phase identification, indexing and lattice parameter determination, Analytical line profile fitting using various models
Neutron diffraction; Reflection High energy electron Diffraction (RHEED), Low energy Electron Diffraction (LEED)
3. Microscopy techniques:
Introduction to Microscopes, Optical microscopy (OM)
Transmission Electron Microscopy (TEM); Basic Electron scattering, Concepts of resolution, TEM instruments, Various imaging modes, Analysis of micrographs, Electron Energy Loss Spectroscopy
Scanning Electron Microscopy, Rutherford backscattering spectrometry
Atomic Force Microscopy, Scanning Probe Microscopy
Electrical resistivity in bulk and thin films, Hall effect, Magnetoresistance
6. Magnetic characterization techniques:
Introduction to Magnetism, Measurement Methods, Measuring Magnetization by Force, Measuring Magnetization by Induction method
Types of measurements using magnetometers: M-H loop, temperature dependent magnetization, time dependent magnetization, Measurements using AC susceptibility, Magneto-optical Kerr effect, Nuclear Magnetic Resonance, Electron Spin Resonance