Characterization of materials is essential to the systematic development of new materials and understanding how they behave in practical applications. This course focuses on the principal methods required to characterize broad range of materials such as metal, alloys, semiconductors, insulators, polymers, ceramics, nanostructures etc. for their applications based on mechanical, electrical, optical, magnetic, thermal properties of materials.
The topics covers structure analysis tools, microscopy techniques, thermal analysis technique, electrical characterization, magnetic characterization, and optical spectroscopy, and other techniques for characterization of nanophase materials. The aim of this course is to provide introductory understanding of number important techniques in terms of the instrumentation, working principles, and information obtained and limitations of each technique.
This course is targeted towards undergraduate and postgraduate students of physics, materials science, metallurgy, energy technology, electrical engineering and electronics, polymer science and engineering etc.
Introduction to materials and Techniques, Structure analysis tools: X-ray diffraction: phase identification, indexing and lattice parameter determination, Analytical line profile fitting using various models, neutron diffraction, Reflection High energy electron Diffraction, and Low energy Electron Diffraction; Microscopy techniques: Optical microscopy, scanning electron microscopy (SEM), energy dispersive X-ray microanalysis (EDS), transmission electron microscopy (TEM), Rutherford backscattering spectrometry (RBS), atomic force microscopy (AFM) and related scanning probe microscopy (SPM), scanning tunneling microscopy (STM);