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Course Co-ordinated by IIT Guwahati
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Dr. A. Perumal
IIT Guwahati

 

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Characterization of materials is essential to the systematic development of new materials and understanding how they behave in practical applications. This course focuses on the principal methods required to characterize broad range of materials such as metal, alloys, semiconductors, insulators, polymers, ceramics, nanostructures etc. for their applications based on mechanical, electrical, optical, magnetic, thermal properties of materials.


The topics covers structure analysis tools, microscopy techniques, thermal analysis technique, electrical characterization, magnetic characterization, and optical spectroscopy, and other techniques for characterization of nanophase materials. The aim of this course is to provide introductory understanding of number important techniques in terms of the instrumentation, working principles, and information obtained and limitations of each technique.


This course is targeted towards undergraduate and postgraduate students of physics, materials science, metallurgy, energy technology, electrical engineering and electronics, polymer science and engineering etc.

Contents:

Introduction to materials and Techniques, Structure analysis tools: X-ray diffraction: phase identification, indexing and lattice parameter determination, Analytical line profile fitting using various models, neutron diffraction, Reflection High energy electron Diffraction, and Low energy Electron Diffraction; Microscopy techniques: Optical microscopy, scanning electron microscopy (SEM), energy dispersive X-ray microanalysis (EDS), transmission electron microscopy (TEM), Rutherford backscattering spectrometry (RBS), atomic force microscopy (AFM) and related scanning probe microscopy (SPM), scanning tunneling microscopy (STM);


Thermal analysis technique: Differential thermal analysis (DTA), Differential Scanning Calorimetry (DSC), Thermogravimetric analysis (TGA); Electrical characterization techniques: Electrical resistivity, Hall effect, deep level transient spectroscopy, Impedance spectroscopy; Magnetic characterization techniques: Magnetoresistance, Susceptibility, magnetic hysteresis, Mossbauer Spectroscopy, Electron Spin Resonance (ESR); Optical characterization techniques: Absorption, transmission, reflection, Fourier transform infrared spectroscopy (FTIR), Photoluminescence, Raman, X-ray photoelectron spectroscopy (XPS);

 

Sl. No.

Module/ Lecture Topics

No. of
Hours

1

1. Introduction

Introduction to materials and Techniques

01 (01)

2

2. Structure analysis tools:

X-ray diffraction

01 (02)

3

Phase identification, indexing and lattice parameter determination, Analytical line profile fitting using various models

03 (05)

4

Neutron diffraction; Reflection High energy electron Diffraction (RHEED), Low energy Electron Diffraction (LEED)

03 (08)

5

3. Microscopy techniques:

Optical microscopy (OM)

01 (09)

6

Transmission Electron Microscopy (TEM); Basic Electron scattering, Concepts of resolution, TEM instruments, Various imaging modes, Analysis of micrographs

04 (13)

7

Scanning Electron Microscopy (SEM), Energy Dispersive X-ray Microanalysis (EDS), Rutherford backscattering spectrometry (RBS)

02 (15)

8

Atomic force microscopy (AFM) and related scanning probe microscopy (SPM), Scanning Tunneling Microscopy (STM)

03 (18)

9

4. Thermal analysis techniques:

Differential thermal analysis (DTA), Differential Scanning Calorimetry (DSC), Thermo-gravimetric analysis (TGA)

04 (22)

10

5. Electrical characterization techniques:

Electrical resistivity in bulk and thin films, Hall effect, Magnetoresistance, Impedance spectroscopy

05 (27)

11

6. Magnetic characterization techniques:

Magnetic property measurements, Magnetic hysteresis loops, time and temperature dependent magnetization measurement

04 (31)

12

Susceptibility, Mossbauer Spectroscopy, Torque magnetometer, Spin polarization measurement, Electron Spin Resonance (ESR)

04 (35)

13

7. Optical characterization techniques:

Absorption, transmission, reflection, Fourier transform infrared spectroscopy (FTIR), Photoluminescence, Raman, X-ray photoelectron spectroscopy (XPS)

05 (40)

 

Total

40

 

  1. Characterization of Materials (Materials Science and Technology: A Comprehensive Treatment, Vol 2A & 2B, VCH (1992).

  2. Semiconductor Material and Device Characterization, 3rd Edition, D. K. Schroder, Wiley-IEEE Press (2006).

  3. Materials Characterization Techniques, S Zhang, L. Li and Ashok Kumar, CRC Press (2008).

  4. Physical methods for Materials Characterization, P. E. J. Flewitt and R K Wild, IOP Publishing (2003).

  5. Characterization of Nanophase materials, Ed. Z L Wang, Willet-VCH (2000).



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