Syllabus  |   Lectures  |   Downloads  |   FAQ  |   Ask a question  |  
Course Co-ordinated by IIT Madras
Coordinators
 
Dr. S. Sankaran
IIT Madras

 

Download Syllabus in PDF format



Untitled Document

It is the first course at the under graduate level on microstructural characterization of materials. This course will cover the basic principles and techniques of X-ray diffraction, optical, scanning electron and transmission electron microscopy along with demonstrations of the instrument details and imaging experiments through videos.  This course also deals with the sample preparation techniques for the microstructural analysis with practical examples through videos.

 

Week

Topics

1.

1. Fundamentals of optics
2. Optical microscope and its instrumental details

2.

 3. Variants in the optical microscopes and image formation
4. Phase contrast, Polarised light, Differential interference contrast, Fluorescence microscopy

3.

5. Sample preparation and applications of optical microscopes

4.

6. Introduction to Scanning electron microscopy (SEM)

5.

7. Instrumental details and image formation of SEM

6.

8. Various imaging techniques and spectroscopy
9. Sample preparation and applications of SEM

7.

10. Fundamentals of X-ray scattering
11. Bragg’s law derivation and the factors affecting the intensity

8.

12. Crystallite size, effect of strain on the intensity
13. Profile fit, indexing, peak broadening

9.

14. Quantitative analysis, residual stress analysis
15. Instrumentation details and demo experiments of XRD

10.

16. Introduction to transmission electron microscopy (TEM)

11.

17. Diffraction and image formation
18. Various imaging techniques and spectroscopy

12.

19. Sample preparation and applications of TEM
20. Instrumentation details and demo experiments of TEM

nil


1) ‘Fundamentals of light microscopy and electronic imaging’  Douglas B. Murphy, 2001, Wiley-Liss, Inc. USA
2) ‘Encyclopedia of Materials Characterization, Surfaces, Interfaces, Thin Films,’ Editors  C. Richard Brundle, Charles A. Evans, Jr., Shaun Wilson, Butterworth-Heinemann, Boston, US
3) ‘Elements of X-ray diffraction’ B.D. Cullity and S.R. Stock, 2001, Prentice Hall, Inc. USA
4) ‘Transmission electron microscopy” D.B. Williams and C. Barry Carter, 4 volumes, Springer, 1996. USA


nil


nil



Important: Please enable javascript in your browser and download Adobe Flash player to view this site
Site Maintained by Web Studio, IIT Madras. Contact Webmaster: nptel@iitm.ac.in