Syllabus  |   Lectures  |   Downloads  |   FAQ  |   Ask a question  |  
Course Co-ordinated by IIT Kanpur
Coordinators
 
Dr. Krishanu Biswas
IIT Kanpur

 
Prof.N.P.Gurao
IIT Kanpur

 

Download Syllabus in PDF format



Untitled Document
 

  1. Advanced Diffraction Techniques: SAXS, SANS, LEED, RHEED, EXAFS.

  2. Advanced Surface Characterization Techniques: XPS,AES, SIMS

  3. Advanced Microscopic Techniques: TEM: HR,HAADF,STEM,In-situ;
    EBSD,AFM,STM, Laser Confocal Microscopy 

  4. Advanced Spectroscopic Techniques: Vis,UV,FTIR, Raman, STEM-EELS

 

Sl. No

Topic

Hours

1.

Introduction to the course: Relevance of advanced characterization to materials development, scientific understanding of phenomena in materials technology

1

2.

Advanced Diffraction Techniques:
Introduction; X-Ray, their production &properties
Review of basic diffraction theory;  

3

3.

  • Various SAXS techniques and its applications in characterizing material

  • SAXS

  • GISAXS

  • LEED and RHEED

  • EXAFS, SEXAFS/NEXAFS

 

4

4.

  • Properties of neutron radiation; neutron sources;

  • Small angle neutron scattering; Examples

2

5.

  • Advanced Surface Characterization Techniques: XPS, AES & SIMS;

  • Importance of surface characterization techniques;

  • Physical principles of XPS, Photoelectric effects;

3

6.

Instrumentation, XPS patterns; Spin orbital Splitting; Quantitative analysis, Chemical effect, Chemical shift, XPS imaging Auger electron generation; Principle, Chemical effect, Quantitative analysis, Depth profiling, Applications

3

7.

Static and Dynamic Secondary Ion Mass, Common modes of analysis, Depth Profiling, quantitative and Qualitative analysis   

3

8.

Comparison surface analysis techniques  

1

9.

Advanced Spectroscopic Techniques: Introduction; Electromagnetic spectroscopy; UV-Visible Spectroscopy; Photo-luminescence spectroscopy; Infra-red spectroscopy;

7

10.

Raman; STEM; EELS

3

11.

Advanced Microscopic Techniques:Introduction; Electron-materials interactions;

1

12.

TEM: HR, HAADF, STEM, In-situ TEM;

4

13.

SEM, EBSD, In-situ SEM

2

14.

AFM, STM

2

15.

Laser Confocal Microscopy

1

Basic knowledge on basic materials characterization techniques is the primary requirement for this course


  1. Materials Characterization Techniques Sam Zhang, Lin Li, Ashok Kumar;CRC press, (2008)

  2. Transmission Electron Microscopy; D.B. Williams and C.B. Carter, Plenum Press (2004)

  3. Modern ESCAThe Principles and Practice of X-Ray Photoelectron Spectroscopy, Terry L.Barr, CRC press, (1994)

  4. Scanning Electron Microscopy and X-ray Microanalysis by Joseph Goldstein, Dale E. Newbury, David C. Joy, and Charles E.; Springer Science (2003)

  5. Advanced Techniques for Materials Characterization, Materials Science Foundations (monograph series) A. K. Tyagi, Mainak Roy, S. K. Kulshreshtha and S. Banerjee;, Volumes 49 – 51 (2009)

  6. Encyclopedia of Materials Characterisation Editors: c.r. Brundle, C.A. Evens, Jr, S. Wilson, Butterworth-Heinmann, Boston (1992)



Important: Please enable javascript in your browser and download Adobe Flash player to view this site
Site Maintained by Web Studio, IIT Madras. Contact Webmaster: nptel@iitm.ac.in