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Course Co-ordinated by IIT Guwahati
Coordinators
 

 
Dr. Santosh Biswas
IIT Guwahati

 

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Digital VLSI Design flow comprises three basic phases: Design, Verification and Test. The video course would cover theoretical, implementation and CAD tools pertaining to these three phases. Although there can be individual full courses for each of these phases, the present course aims at covering the important problems/algorithms/tools so that students get a comprehensive idea of the whole digital VLSI design flow.

VLSI Design: High level Synthesis, Verilog RTL Design, Combinational and Sequential Synthesis Logic Synthesis (for large circuits).

Verification Techniques: Introduction to Hardware Verification and methodologies, Binary Decision Diagrams(BDDs) and algorithms over BDDs, Combinational equivalence checking, Temporal Logics, Modeling sequential systems and model checking, Symbolic model checking.

VLSI Testing: Introduction, Fault models, Fault Simulation, Test generation for combinational circuits, Test generation algorithms for sequential circuits and Built in Self test.

 

 

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Design

Module I: Introduction
       Lecture I: Introduction to Digital VLSI Design Flow
       Lecture II:  High Level Design Representation
       Lecture III: Transformations for High Level Synthesis

Module II: Scheduling, Allocation and Binding
            Lecture I:   Introduction to HLS: Scheduling, Allocation and Binding Problem
            Lecture II and III:  Scheduling Algorithms           
Lecture IV: Binding and Allocation Algorithms

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Module III: Logic Optimization and Synthesis
            Lecture I,II and III:  Two level Boolean Logic Synthesis
            Lecture IV: Heuristic Minimization of Two-Level Circuits
            Lecture V: Finite State Machine Synthesis
            Lecture VI: Multilevel Implementation

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Verification

Module - IV: Temporal Logic
        Lecture-I: Introduction to formal methods for verification
        Lecture-II: Temporal Logic: Introduction and Basic Operators
        Lecture-III: Syntax and Semantics of CTL
        Lecture IV: Equivalence between CTL Formulas

 

Module - V: Binary Decision Diagram
        Lecture-I: Binary Decision Diagram: Introduction and construction
        Lecture-II: Ordered Binary Decision Diagram
        Lecture-III: Operations on Ordered Binary Decision Diagram
        Lecture-IV: Ordered Binary Decision Diagram for Sequential Circuits

 

Module-VI: Verification Techniques
        Lecture-I: Introduction to Verification Techniques
Lecture-II and III: Model Checking
        Lecture-IV and V: Symbolic Model Checking

3.

Test

Module  VII: Introduction to Digital Testing
        Lecture-I: Introduction to Digital VLSI Testing
        Lecture-II:  Functional and Structural Testing
        Lecture-III: Fault Equivalence

Module  VIII: Fault Simulation and Testability Measures
       Lecture-I, II and III: Fault Simulation
       Lecture-IV: Testability Measures (SCOAP)

       

Module IX: Combinational Circuit Test Pattern Generation
        Lecture-I: Introduction to Automatic Test Pattern Generation (ATPG) and ATPG
                         Algebras
        Lecture-II and III: D-Algorithm

Module  X: Sequential Circuit Testing and Scan Chains
        Lecture-I:  ATPG for Synchronous Sequential Circuits
        Lecture-II and III: Scan Chain based Sequential Circuit Testing

Module XI: Built in Self test (BIST)
         Lecture I and II: Built in Self Test        
         Lecture III and IV:  Memory Testing

 

  1. Digital Design
  2. Algorithm
  3. Automata Theory (Basics)

  1. D. D. Gajski, N. D. Dutt, A.C.-H. Wu and S.Y.-L. Lin, High-Level Synthesis: Introduction to Chip and System Design, Springer, 1st edition, 1992.
  2. S. Palnitkar, Verilog HDL: A Guide to Digital Design and Synthesis, Prentice Hall, 2nd edition, 2003.
  3. G. De Micheli. Synthesis and optimization of digital circuits, 1st edition, 1994.
  4. M. Huth and M. Ryan, Logic in Computer Science modeling and reasoning about systems, Cambridge University Press, 2nd Edition, 2004
  5. Bushnell and Agrawal, Essentials of Electronic Testing for Digital, Memory & Mixed-Signal Circuits, Kluwer Academic Publishers, 2000



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